Agilent Medalist Bead Probe Technology, or AM-BPT, is a new method that allows probing of PCB traces without adding large test pads. 

* Allows probing of very small traces without disrupting trace routing.

* Allows incircuit probe access to high-speed lines (to 10 Gb/sec) with no measurable degradation in circuit performance.

* More details? Go to the Technology page.

Using Agilent Medalist Bead Probe Technology requires no additional steps in manufacturing or test. However, there are differences in the layout, design, manufacturing, and test processes needed to implement AM-BPT.

Caber Contacts LLC is the coinventor of Agilent Medalist Bead Probe Technology and can guide your company to successful implementation.

"Agilent Medalist Bead Probe Technology" and "AM-BPT" are the intellectual property of Agilent Technologies, Inc.